Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...
Intel this week revealed defect density metrics for its 18A (1.8nm-class) process technology and said that it was healthy at the Deutsche Bank's 2024 Technology Conference. The company also said that ...
A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...
TSMC exposed the defect density (D0) of its N2 process technology relative to its predecessors at the same stage of development at its North American Technology Symposium this week. According to the ...
Professor Hyuk-Jun Kwon's team developed ultrahigh-resolution optical doping technology based on microlenses - The technology could potentially be implemented in next-generation 2D semiconductor-based ...
(Nanowerk News) Metal-organic framework (MOF) nanocrystals are hybrid materials, built from metal clusters and organic linkers with an almost unlimited number of possible combinations. Their ...
The Effect Of Pattern Loading On BEOL Yield And Reliability During Chemical Mechanical Planarization
Chemical mechanical planarization (CMP) is required during semiconductor processing of many memory and logic devices. CMP is used to create planar surfaces and achieve uniform layer thickness during ...
Researchers have uncovered a major cause of limitations to efficiency in a new generation of solar cells. Researchers in the materials department in UC Santa Barbara's College of Engineering have ...
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